Volume 6, Issue 1, March 2018, Page: 1-7
Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range
Patrick Damson Nsimama, Department of Science and Laboratory Technology, Dar Es Salaam Institute of Technology, Dar Es Salaam, Tanzania
Received: Nov. 18, 2017;       Accepted: Dec. 21, 2017;       Published: Jan. 16, 2018
DOI: 10.11648/j.ajop.20180601.11      View  2385      Downloads  131
The morphological, structural and photoluminescence (PL) of laser ablated SrAl2O4:Eu2+, Dy3+ thin films deposited on optimum substrate temperature range of 200-500°C are reported. The 200-500°C substrate temperature was considered, since on that range, low cost highly emitting SrAl2O4:Eu2+, Dy3+ thin films are always produced. The surface morphology analysis of the films was done by using the scanning electron microscopy (SEM) and atomic force microscopy (AFM). The energy dispersive X-ray spectrometer (EDS) was employed for elemental composition analysis. The structural analysis was done by the X-ray diffraction (XRD) technique. The photoluminescence (PL) data collection was done by using Cary Eclipse fluorescence spectrophotometry. The films were excited by the UV light from the xenon lamp. The highest green emission intensity with a peak at 517 nm and highest initial afterglow intensity were recorded by the sample that was deposited at 350°C. The green peak at 517 nm is attributed to 4f65d1 → 4f7 Eu2+ transitions. AFM images with well defined grains were observed on the films deposited at temperatures higher than 200°C. The EDS elemental composition analysis showed that the films consist of all the main elements of SrAl2O4:Eu2+, Dy3+, i.e., Al, Sr, O. The changes in the film photoluminescence and morphology with the substrate temperature are discussed.
SrAl2O4:Eu2+, Dy3+, SEM, AFM, Thin Film, Substrate Temperature, PL
To cite this article
Patrick Damson Nsimama, Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range, American Journal of Optics and Photonics. Vol. 6, No. 1, 2018, pp. 1-7. doi: 10.11648/j.ajop.20180601.11
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