A Study of Beam Parameters Using NLSE in Chalcogenide Glass Through Variational Method with a Gaussian Trial Function
Chironjit Hazarika,
Abhijeet Das,
Subrata Hazarika
Issue:
Volume 3, Issue 4, August 2015
Pages:
43-47
Received:
14 July 2015
Accepted:
29 July 2015
Published:
11 August 2015
Abstract: Using variational method for an elliptical Gaussian optical beam trial function, self –action in bulk chalcogenide glass (Kerr media) is investigated. Emphasis is laid on the study of variation in beam width, curvature, phase and intensity of the beam with propagation distance. Solutions predict stationary self-focusing of the elliptical beam and an effective beam collapse at 10Pcr input power. These study is significant in the choice of parameters in optical communications
Abstract: Using variational method for an elliptical Gaussian optical beam trial function, self –action in bulk chalcogenide glass (Kerr media) is investigated. Emphasis is laid on the study of variation in beam width, curvature, phase and intensity of the beam with propagation distance. Solutions predict stationary self-focusing of the elliptical beam and a...
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The Ellipsometrical Analysis of External Reflection of Light on Superficial Films on Solid Substrates
Issue:
Volume 3, Issue 4, August 2015
Pages:
48-53
Received:
17 July 2015
Accepted:
29 July 2015
Published:
11 August 2015
Abstract: The ellipsometrical analysis of the external specular reflection of light on nonabsorbing superficial films allows us to know factors which influence the ellipsometric measurement of the analyzed system. For optical nonabsorbing superficial films the curves =f(df) and =f(df) are periodical, while the curves =f() are closed. The paper presents observations on the dependence of the ellipsometric parameters and on df. The analysis of the periodicity of these curves allows us to correctly determine the film thickness for thicknesses greater than dmin. The value of dmin depends on the refractive index nf of the surface film, the incidence angle φ0 and the wavelength λ of the incident radiation. The dependence of dmin on nf, φ0 and λ is analyzed. From the curve shape we can draw conclusions with respect to the domain of small errors, allowing us to correctly determine the thickness and refraction index of superficial films.
Abstract: The ellipsometrical analysis of the external specular reflection of light on nonabsorbing superficial films allows us to know factors which influence the ellipsometric measurement of the analyzed system. For optical nonabsorbing superficial films the curves =f(df) and =f(df) are periodical, while the curves =f() are closed. The paper presents o...
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